Patent · US Expired

Method and system for coating and developing

US6875281B2 · kind B2 · utility

7Cited by
17References
9Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 7, 2001
Grant dateApr 5, 2005
Priority date
Expiry dateApr 8, 2022

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S414/135
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A system for performing a coating and developing treatment for a substrate. The system includes a processing zone having a coating treatment unit, a developing treatment unit, and a heat treatment unit. An interface section carries the substrate between the processing zone and an aligner not included in the system for performing an exposure processing for the substrate. A unit measures the density of impurities at least inside the processing zone or the interface section, and a reduced-pressure impurity removing unit has a chamber which can be closed airtightly for reducing the pressure inside the chamber to a predetermined pressure before the substrate undergoes the exposure processing to remove the impurities adhering to the coating layer on the substrate inside the chamber for a predetermined time. A reduced-pressure control unit controls at least the predetermined pressure or predetermined time based on the value measured by the density measuring unit.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.