Patent · US Expired

Formation of amorphous carbon ARC stack having graded transition between amorphous carbon and ARC material

US6875664B1 · kind B1 · utility

21Cited by
20References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 29, 2002
Grant dateApr 5, 2005
Priority date
Expiry dateJan 28, 2023

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/02274
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method of forming an integrated circuit using an amorphous carbon hard mask involves providing an amorphous carbon material layer above a layer of conductive material and providing an anti-reflective coating (ARC) material layer above the amorphous carbon material. A transition region is formed intermediate the amorphous carbon material layer and the ARC material layer. The transition region has a concentration profile that provides a transition between the amorphous carbon material layer and the ARC material layer. A portion of the amorphous carbon material layer, the ARC material layer, and the transition region is removed to form a hard mask, and a feature is formed in the layer of conductive material according to the hard mask.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.