Patent · US Expired

Process endpoint detection in processing chambers

US6878214B2 · kind B2 · utility

3Cited by
21References
11Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 24, 2002
Grant dateApr 12, 2005
Priority date
Expiry dateMar 13, 2022

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S438/905
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

Method and apparatus for determining an endpoint of a cleaning process running in a chamber. In particular, one embodiment of the present invention is a method that includes steps of: (a) directing radiation absorbed by a byproduct of the cleaning process into an exhaust line of the chamber; (b) detecting a measure of absorbance of the radiation by the byproduct; and (c) determining the endpoint when the measure of absorbance falls within a predetermined window.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.