Patent · US Expired

Interconnect arrangement and method for fabricating an interconnect arrangement

US6888244B2 · kind B2 · utility

6Cited by
4References
22Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 1, 2002
Grant dateMay 3, 2005
Priority date
Expiry dateMar 1, 2022

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/0002
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

An interconnect arrangement (100) has a first layer (101), a first layer surface (102), thereon at least two interconnects (104) having a second layer surface (105) essentially parallel to the first layer surface (102), thereon a respective second layer (106) for each interconnect (104), the second layers (106) of adjacent interconnects covering regions between the adjacent interconnects (104), and thereon a third layer (107), which completely closes off the regions between the adjacent interconnects (104) by means of coverage.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.