Patent · US Expired

Method and apparatus for monitoring a process by employing principal component analysis

US6896763B2 · kind B2 · utility

10Cited by
13References
12Claims
0Family size

Inventors

Key dates

Filing dateJan 14, 2003
Grant dateMay 24, 2005
Priority date
Expiry dateJan 14, 2023

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2201/1293
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method and apparatus for monitoring a process by employing principal component analysis are provided. Correlated attributes are measured for the process to be monitored (the production process). Principal component analysis then is performed on the measured correlated attributes so as to generate at least one production principal component; and the at least one production principal component is compared to a principal component associated with a calibration process (a calibration principal component). The calibration principal component is obtained by measuring correlated attributes of a calibration process, and by performing principal component analysis on the measured correlated attributes so as to generate at least one principal component. A principal component having a feature indicative of at least one of a desired process state, process event and chamber state then is identified and is designated as the calibration principal component.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.