System and method for processing tester information and visualization for parameter with multiple distributions in integrated circuit technology development
US6907379B1 · kind B1 · utility
1Cited by
4References
16Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Nov 25, 2002 |
| Grant date | Jun 14, 2005 |
| Priority date | — |
| Expiry date | Apr 16, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/3004
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system and method are provided for processing tester information including means of determining axis information and means of determining break information for the tester information. The axis information and the break information are applied to the tester information to provide disjointed tester information. The disjointed tester information is then plotted on a disjointed axis graph.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.