Patent · US Expired

Method for fabricating encapsulated semiconductor components

US6908784B1 · kind B1 · utility

234Cited by
36References
75Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 6, 2002
Grant dateJun 21, 2005
Priority date
Expiry dateAug 23, 2022

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D62/117
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A semiconductor component includes a thinned semiconductor die having protective polymer layers on up to six surfaces. The component also includes contact bumps on the die embedded in a circuit side polymer layer, and terminal contacts on the contact bumps in a dense area array. A method for fabricating the component includes the steps of providing a substrate containing multiple dice, forming trenches on the substrate proximate to peripheral edges of the dice, and depositing a polymer material into the trenches. In addition, the method includes the steps of planarizing the back side of the substrate to contact the polymer filled trenches, and cutting through the polymer trenches to singulate the components from the substrate. Prior to the singulating step the components can be tested and burned-in while they remain on the substrate.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.