Patent · US Expired

Flash memory structure and operating method thereof

US6914826B2 · kind B2 · utility

8Cited by
1References
9Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 11, 2004
Grant dateJul 5, 2005
Priority date
Expiry dateMay 11, 2024

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C16/0491
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A flash memory structure is provided. The flash memory structure includes a P-type substrate, a deep N-well set up within the P-type substrate, a P-well set up within the deep N-well, a pair of gate structures set up over the substrate, a select gate set up between the pair of gate structure and N-type source/drain regions in the P-well on each side of the gate structure. Since each pair of neighboring gate structure uses a common gate, the level of integration of device can be increased.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.