Patent · US Expired

Method and apparatus for calibrating a multiport test system for measurement of a DUT

US6920407B2 · kind B2 · utility

153Cited by
27References
24Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 7, 2004
Grant dateJul 19, 2005
Priority date
Expiry dateJul 6, 2024

Classification

  • Technology area (CPC C)Chemistry; Metallurgy
  • CPC primaryC01B32/15
  • WIPO fieldMicro-structural and nano-technology
  • WIPO sectorChemistry

Abstract

A method and apparatus for measuring a multiport device using a multiport test set connects one port of the multiport device to a stimulus signal and terminates all remaining ports in a respective load. A response to a stimulus signal is measured on all ports of the multiport device and the measured responses are corrected with calibration data to characterize the multiport device.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.