Cross-point MRAM array with reduced voltage drop across MTJ's
US6930915B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Jun 19, 2003 |
| Grant date | Aug 16, 2005 |
| Priority date | — |
| Expiry date | Jul 26, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C11/15
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method of storing information in a cross-point magnetic memory array and a cross-point magnetic memory device structure. The voltage drop across magnetic tunnel junctions (MTJ's) during a write operation is minimized to prevent damage to the MTJ's of the array. The voltage drop across the selected MTJ's, the unselected MTJ's, or both, is minimized during a write operation, reducing stress across the MTJ's, decreasing leakage currents, decreasing power consumption and increasing the write margin.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.