Semiconductor device testing contactor having a circuit-side contact piece and test-board-side contact piece
US6939142B2 · kind B2 · utility
16Cited by
8References
10Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Dec 19, 2000 |
| Grant date | Sep 6, 2005 |
| Priority date | — |
| Expiry date | Dec 19, 2020 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10T29/49218
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A contactor is placed between a semiconductor device and a test board. A contact electrode of the contactor electrically connects the semiconductor device to the test board. The contact electrode is formed of a conductive layer provided on an insulating substrate. The contact electrode includes a first contact piece which contacts a terminal of the semiconductor device, a second contact piece which contacts an electrode of the test board, and a connecting portion which electrically connects the first contact piece and the second contact piece.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.