Patent · US Expired

Multi-charged beam lens, charged-particle beam exposure apparatus using the same, and device manufacturing method

US6946662B2 · kind B2 · utility

7Cited by
2References
19Claims
0Family size

Assignees

Inventors

Key dates

Filing dateJul 10, 2003
Grant dateSep 20, 2005
Priority date
Expiry dateJan 19, 2024

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J2237/1205
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

There is provided a multi-charged beam lens constituted by stacking, via fiber chips serving as insulator members along the optical path of a charged beam, a plurality of electrodes having a charged beam passing region where a plurality of charged beam apertures are formed. The electrodes have shield apertures between the charged beam passing region and the fiber chips. A conductive shield extends through the shield apertures without contacting the electrodes, and cuts off a straight path which connects the charged beam passing region and the fiber chips serving as insulator members. This prevents the influence of charge-up of the insulator members on an electron beam in the multi-charged beam lens.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.