Method and installation for fast fault localization in an integrated circuit
US6948107B1 · kind B1 · utility
0Cited by
9References
35Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | May 21, 1999 |
| Grant date | Sep 20, 2005 |
| Priority date | — |
| Expiry date | May 21, 2019 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31903
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention relates to a method and an installation for fast location of a fault in an integrated circuit. A sequence of NRZ location vectors is created, the abnormal location vectors are determined, for which the value of the electrical consumption current at rest IDDQ of the circuit is abnormal, at least one set of images is produced with an abnormal location vector, and at least one abnormal vector image is compared with a reference image.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.