Philippe Perdu
13Patents
6h-index
12Co-inventors
55Inventor score
Filing activity: May 21, 1999 → Apr 25, 2006
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7190822B2 | Method for customizing an integrated circuit element | Physics | 20 | Expired |
| US6967491B2 | Spatial and temporal selective laser assisted fault localization | Physics | 18 | Expired |
| US6943572B2 | Apparatus and method for detecting photon emissions from transistors | Physics | 10 | Expired |
| US6891363B2 | Apparatus and method for detecting photon emissions from transistors | Physics | 9 | Expired |
| US7439730B2 | Apparatus and method for detecting photon emissions from transistors | Physics | 7 | Expired |
| US7400154B2 | Apparatus and method for detecting photon emissions from transistors | Physics | 6 | Expired |
| US7323862B2 | Apparatus and method for detecting photon emissions from transistors | Physics | 4 | Expired |
| US7408342B2 | Device for measuring a component of current based on magnetic fields | Physics | 3 | Expired |
| US7038442B2 | Apparatus and method for detecting photon emissions from transistors | Physics | 3 | Expired |
| US7417424B2 | Magnetic-field-measuring device | Physics | 2 | Expired |
| US7411391B2 | Magnetic-field-measuring probe | Physics | 2 | Expired |
| US6816614B1 | Method for comparing recorded pixel images representing equipotential lines of at least an integrated circuit chip | Physics | 1 | Expired |
| US6948107B1 | Method and installation for fast fault localization in an integrated circuit | Physics | 0 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.