Patent · US Expired

Method of fabricating a microfabricated high aspect ratio device with electrical isolation

US6960488B2 · kind B2 · utility

69Cited by
25References
19Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 29, 1999
Grant dateNov 1, 2005
Priority date
Expiry dateJun 29, 2019

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01P2015/0814
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A microfabricated device having a high vertical aspect ratio and electrical isolation between a structure region and a circuit region. The device may be fabricated on a single substrate and may include electrical interconnections between the structure region and the circuit region. The device includes a substrate and an isolation trench surrounding a structure region in the substrate. The isolation trench includes a lining of a dielectric insulative material. A plurality of microstructure elements are located in the structure region and are laterally anchored to the isolation trench.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.