Universal diagnostic platform for specimen analysis
US6961672B2 · kind B2 · utility
7Cited by
6References
20Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Mar 5, 2003 |
| Grant date | Nov 1, 2005 |
| Priority date | — |
| Expiry date | May 14, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2887
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A universal diagnostic platform (UDP) is described which incorporates several measurement modules for testing a device under test (DUT). Users can switch between measurement modules without removing the DUT. The UDP employs a common fixturing and software system for all the modules.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.