Steven Kasapi
25Patents
10h-index
24Co-inventors
71Inventor score
Filing activity: Jan 13, 2000 → Jan 15, 2016
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6812464B1 | Superconducting single photon detector | Physics | 65 | Expired |
| US6859031B2 | Apparatus and method for dynamic diagnostic testing of integrated circuits | Physics | 44 | Expired |
| US6836131B2 | Spray cooling and transparent cooling plate thermal management system | Physics | 33 | Expired |
| US7049593B2 | Superconducting single photon detector | Physics | 25 | Expired |
| US6252222A | Differential pulsed laser beam probing of integrated circuits | Physics | 24 | Expired |
| US7042563B2 | Optical coupling for testing integrated circuits | Physics | 23 | Expired |
| US7450245B2 | Method and apparatus for measuring high-bandwidth electrical signals using modulation in an optical probing system | Physics | 19 | Expired |
| US6976234B2 | Apparatus and method for measuring characteristics of dynamic electrical signals in integrated circuits | Physics | 18 | Expired |
| US7012537B2 | Apparatus and method for determining voltage using optical observation | Physics | 13 | Expired |
| US7733100B2 | System and method for modulation mapping | Physics | 11 | Active |
| US6985219B2 | Optical coupling for testing integrated circuits | Physics | 10 | Expired |
| US6891363B2 | Apparatus and method for detecting photon emissions from transistors | Physics | 9 | Expired |
| US7990167B2 | System and method for modulation mapping | Physics | 9 | Active |
| US7679358B2 | System and method for voltage noise and jitter measurement using time-resolved emission | Physics | 7 | Active |
| US6961672B2 | Universal diagnostic platform for specimen analysis | Physics | 7 | Expired |
| US7439730B2 | Apparatus and method for detecting photon emissions from transistors | Physics | 7 | Expired |
| US7616312B2 | Apparatus and method for probing integrated circuits using laser illumination | Physics | 7 | Expired |
| US6956365B2 | System and method for calibration of testing equipment using device photoemission | Physics | 5 | Expired |
| US7323862B2 | Apparatus and method for detecting photon emissions from transistors | Physics | 4 | Expired |
| US8686748B2 | System and method for modulation mapping | Physics | 3 | Active |
| US7038442B2 | Apparatus and method for detecting photon emissions from transistors | Physics | 3 | Expired |
| US7478345B2 | Apparatus and method for measuring characteristics of dynamic electrical signals in integrated circuits | Physics | 1 | Expired |
| US9239357B2 | System and method for modulation mapping | Physics | 1 | Active |
| US9915700B2 | System and method for modulation mapping | Physics | 0 | Active |
| US7227580B2 | Knife edge tracking system and method | Physics | 0 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.