Patent · US Expired

Controlled method for segmented electrode apparatus and method for plasma processing

US6962664B2 · kind B2 · utility

50Cited by
9References
12Claims
0Family size

Assignee

Inventor

Key dates

Filing dateFeb 4, 2003
Grant dateNov 8, 2005
Priority date
Expiry dateSep 25, 2023

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J37/32568
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

An electrode assembly (50) and an associated plasma reactor system (10) and related methods for a variety of plasma processing applications. The electrode assembly provides control of a plasma density profile (202) within an interior region (30) of a plasma reactor chamber (20). The electrode assembly includes an upper electrode (54) having a lower surface (54L), an upper surface (54U) and an outer edge (54E). The lower surface of the upper electrode faces interior region of the plasma chamber housing the plasma (200), and thus interfaces with the plasma. The electrode assembly further includes a segmented electrode (60) arranged proximate to and preferably substantially parallel with the upper surface of the upper electrode. The segmented electrode comprises two or more separated electrode segments (62a, 62b, . . . 62n), each having an upper and lower surface. Each electrode segment is spaced apart from the upper electrode upper surface by a corresponding controlled gap (Ga, Gb, . . . Gn). The electrode assembly may further include one or more actuators (110) attached to one or more electrode segments at the upper surface of the one or more electrode segments. The actuators allow …

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.