Device transfer mechanism for a test handler
US6967475B2 · kind B2 · utility
8Cited by
6References
24Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jan 22, 2004 |
| Grant date | Nov 22, 2005 |
| Priority date | — |
| Expiry date | Jan 22, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2893
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention provides a mechanism for a test handler using for electrical testing of electronic devices. The devices are placed on a platform configured to move semiconductor devices from an onloading position to an offloading position along a predetermined path. A transfer arm with a plurality of transfer heads connected to it is located adjacent the path. The transfer heads are configured to pick up and transfer semiconductor devices from the platform to a testing position for testing, and thereafter to transfer the semiconductor devices from the testing position to the platform for offloading.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.