Patent · US Expired

Memory and method for employing a checksum for addresses of replaced storage elements

US6981175B2 · kind B2 · utility

2Cited by
9References
40Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 28, 2001
Grant dateDec 27, 2005
Priority date
Expiry dateJun 8, 2023

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C29/785
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A memory includes: a memory array having a plurality of storage elements; a plurality of replacement storage elements; a plurality of address fuse units, each having a plurality of fusible links and being operable to store a replacement address, each replacement address identifying one of the storage elements of the memory array to be replaced by an associated one of the replacement storage elements and forming a respective 2m bit row or 2n bit column of a fuse array; a vector generator operable to produce a 2n bit row vector based on the rows of the fuse array and to produce a 2m bit column vector based on the columns of the fuse array; and a compression unit operable to produce a row checksum from the row vector and to produce a column checksum from the column vector.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.