Patent · US Expired

Semiconductor structure implementing low-K dielectric materials and supporting stubs

US6984892B2 · kind B2 · utility

14Cited by
10References
8Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 28, 2001
Grant dateJan 10, 2006
Priority date
Expiry dateMar 28, 2021

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/0002
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A semiconductor device is provided. The semiconductor device includes a substrate having transistor devices and a plurality of copper interconnect metallization lines and conductive vias. The plurality of copper interconnect metallization lines and conductive vias are defined in each of a plurality of interconnect levels of the semiconductor device such that the plurality of copper interconnect metallization lines and conductive vias are isolated from each other by an air dielectric. The semiconductor device further includes a plurality of supporting stubs each of which is configured to form a supporting column that extends through the plurality of interconnect levels of the semiconductor device.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.