Patent · US Expired

Hydrogen-based phosphosilicate glass process for gap fill of high aspect ratio structures

US7001854B1 · kind B1 · utility

22Cited by
17References
54Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 11, 2002
Grant dateFeb 21, 2006
Priority date
Expiry dateMay 9, 2023

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/02274
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

Chemical vapor deposition processes are employed to fill high aspect ratio (typically at least 3:1), narrow width (typically 1.5 microns or less and even sub 0.13 micron) gaps with significantly reduced incidence of voids or weak spots. This deposition process involves the use of hydrogen and a phosphorus dopant precursor as process gasses in the reactive mixture of a plasma containing CVD reactor. The process gas also includes dielectric forming precursor molecules such as silicon and oxygen containing molecules.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.