Patent · US Expired

Absolute wavelength calibration of lithography laser using multiple element or tandem see through hollow cathode lamp

US7006541B2 · kind B2 · utility

2Cited by
82References
8Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 29, 2003
Grant dateFeb 28, 2006
Priority date
Expiry dateJan 20, 2024

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01S3/1392
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

A tunable laser system includes a gain medium and an optical resonator for generating a laser beam, and a spectral narrowing and tuning unit within the resonator. A detection and control unit controls a relative wavelength of the laser system. A wavelength calibration module calibrates the detection and control unit. The module contains more than one species each having an optical transition line within the tuning spectrum of the laser. A beam portion of the narrowed emission from the laser is directed through the wavelength calibration module and a beam portion is directed through the detection and control unit when the laser beam is scanned through the optical transition line of each of the species within the module. The detection and control unit is monitored and calibrated during the scanning.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.