Patent · US Expired

Timing generator and test apparatus

US7010729B2 · kind B2 · utility

9Cited by
5References
14Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 10, 2004
Grant dateMar 7, 2006
Priority date
Expiry dateAug 7, 2024

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C29/50012
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A timing generator includes a reference clock generating unit for outputting a reference clock at a predetermined time interval, a first variable delay circuit unit for receiving the reference clock and outputting a first delay signal which results from delaying the reference clock, a second variable delay circuit unit for receiving the reference clock and outputting a second delay signal which results from delaying the reference clock, a delay control unit for controlling delay amounts of the first and second variable delay circuit units, and a timing generating unit for generating the timing signal based on the first and second delay signals, wherein the first and second delay control units increase or decrease the delay amounts of the first and second variable delay circuit units to be increased or decreased whenever the reference clock generating unit generates the reference clock.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.