Inventor · Tokyo, JP

Masaru Doi

18Patents
5h-index
16Co-inventors
63Inventor score

Filing activity: Nov 6, 1986 → Dec 21, 2010

Most-cited inventions

PatentTitleAreaCited byStatus
US7945826B2 Test apparatus and test method Physics 12 Active
US7406646B2 Multi-strobe apparatus, testing apparatus, and adjusting method Physics 11 Active
US7010729B2 Timing generator and test apparatus Physics 9 Expired
US6990613B2 Test apparatus Physics 7 Expired
US7216271B2 Testing apparatus and a testing method Physics 5 Expired
US7765449B2 Test apparatus that tests a plurality of devices under test having plural memory cells and test method therefor Physics 5 Active
US7461316B2 Multi-strobe generation apparatus, test apparatus and adjustment method Electricity 5 Active
US4772967A Magnetic recording apparatus in a helical scan system Physics 5 Expired
US7203611B2 Timing generator, test apparatus and skew adjusting method Physics 4 Expired
US7640127B2 Detection apparatus, detection method, and program Physics 4 Active
US7283920B2 Apparatus and method for testing semiconductor device Physics 4 Expired
US7634695B2 Test apparatus and selection apparatus Physics 3 Active
US6953503B2 Method of manufacturing molded body, slurry for molding, core for molding, method of manufacturing core for molding, hollow ceramic molded body, and light emitting container Emerging Cross-Sectional Technologies 3 Expired
US7805641B2 Test apparatus for regulating a test signal supplied to a device under test and method thereof Physics 2 Active
US7190174B2 Method for calibrating timing clock Physics 2 Active
US7363556B2 Testing apparatus and testing method Physics 2 Active
US7407145B2 Core for molding hollow ceramic molded body and light emitting container Emerging Cross-Sectional Technologies 1 Active
US8601329B2 Test apparatus and test method Physics 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.