Manual control with force-feedback for probe microscopy-based force spectroscopy
US7013717B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 6, 2001 |
| Grant date | Mar 21, 2006 |
| Priority date | — |
| Expiry date | Jan 3, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01Q10/065
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A probe microscope includes a probe and a scanner, the scanner generating relative motion between a probe and a sample. In addition, a manual input device is provided to control a separation between a sample and a probe. The detector is used to generate a signal related to movement of the probe (for example, deflection). Moreover, the microscope has an alerting device that is responsive to the signal to provide feedback to an operator, the feedback being indicative of interaction between the sample and the probe. Preferably, the manual input device is a rotatable knob. Also, the alerting device is preferably a mechanical resistance device coupled to the knob to provide the feedback to the user.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.