Jens Struckmeier
7Patents
4h-index
7Co-inventors
46Inventor score
Filing activity: Dec 6, 2001 → Oct 12, 2020
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7044007B2 | Force scanning probe microscope | Emerging Cross-Sectional Technologies | 18 | Expired |
| US7810166B2 | Device and method for scanning probe microscopy | Physics | 15 | Expired |
| US7013717B1 | Manual control with force-feedback for probe microscopy-based force spectroscopy | Physics | 13 | Expired |
| US6677697B2 | Force scanning probe microscope | Emerging Cross-Sectional Technologies | 12 | Expired |
| US7387035B2 | Method of making a force curve measurement on a sample | Emerging Cross-Sectional Technologies | 4 | Active |
| US12232295B2 | Computing center and method | Emerging Cross-Sectional Technologies | 1 | Active |
| US9958882B2 | Heating system and method for heating a building and/or for preparing hot water | Emerging Cross-Sectional Technologies | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.