System and method for inspection using off-angle lighting
US7024031B1 · kind B1 · utility
9Cited by
12References
25Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Oct 23, 2001 |
| Grant date | Apr 4, 2006 |
| Priority date | — |
| Expiry date | Sep 19, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/95638
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system for inspecting components is provided. The system includes an axial lighting system that illuminates the component with axial lighting to allow one or more features of the component to be located, such as by causing protruding features to be brighter than the background and recessed features to be darker than the background. An off-axis lighting system illuminates the component with off-axis lighting in the absence of the axial lighting to allow the component to be inspected to locate one or more features, such as a bump contact.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.