August Technology Corp.
🏢 View company profile →16Patents
1Active
16Granted
34Portfolio score
Filing activity: Jul 20, 1994 → Jul 14, 2004 · 1 expiring within 5 years
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6324298A | Automated wafer defect inspection system and a process of performing such inspection | Electricity | 186 | Expired |
| US5580163A | Focusing light source with flexible mount for multiple light-emitting elements | Emerging Cross-Sectional Technologies | 89 | Expired |
| US6937753B1 | Automated wafer defect inspection system and a process of performing such inspection | Electricity | 55 | Expired |
| US6826298B1 | Automated wafer defect inspection system and a process of performing such inspection | Electricity | 21 | Expired |
| US8045788B2 | Product setup sharing for multiple inspection systems | Emerging Cross-Sectional Technologies | 17 | Active |
| US6947588B2 | Edge normal process | Physics | 15 | Expired |
| US6731383B2 | Confocal 3D inspection system and process | Physics | 11 | Expired |
| US6773935B2 | Confocal 3D inspection system and process | Physics | 10 | Expired |
| US7024031B1 | System and method for inspection using off-angle lighting | Physics | 9 | Expired |
| US7019841B2 | System and method for inspecting a component using interferometry | Physics | 8 | Expired |
| US6870609B2 | Confocal 3D inspection system and process | Physics | 7 | Expired |
| US6820349B2 | End effector alignment tool for substrate handling system | Electricity | 7 | Expired |
| US6970287B1 | Confocal 3D inspection system and process | Physics | 6 | Expired |
| US6882415B1 | Confocal 3D inspection system and process | Physics | 5 | Expired |
| US7046837B2 | System and method for locating irregular edges in image data | Physics | 4 | Expired |
| US7111095B2 | Data transfer device with data frame grabber with switched fabric interface wherein data is distributed across network over virtual lane | Physics | 1 | Expired |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.