Sanjeev Mathur
3Patents
2h-index
7Co-inventors
30Inventor score
Filing activity: Oct 23, 2001 → Dec 19, 2003
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7024031B1 | System and method for inspection using off-angle lighting | Physics | 9 | Expired |
| US7019841B2 | System and method for inspecting a component using interferometry | Physics | 8 | Expired |
| US7158235B2 | System and method for inspection using white light interferometry | Physics | 2 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.