Patent · US Expired

Method of optimizing the timing between signals

US7024326B2 · kind B2 · utility

4Cited by
1References
19Claims
0Family size

Assignee

Inventor

Key dates

Filing dateApr 30, 2004
Grant dateApr 4, 2006
Priority date
Expiry dateMay 27, 2024

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH03K2005/00104
  • WIPO fieldBasic communication processes
  • WIPO sectorElectrical engineering

Abstract

A method of optimizing the timing between signals to be latched and a respective latching clock signal is suggested wherein test timings are provided according to which a delay test value of a clock delay line (CDL) are generated. According to the delay test values a clock signal (C) and a sample signal (S) are received through said clock delay line (CDL) and through said sample signal line (SSL), respectively. Respective phase differences for the distinct delay test values are obtained. A delay value is chosen and set for operation for which the respective obtained phase difference fits best to given target timing data.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.