Method for testing circuit units to be tested and test apparatus
US7039544B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Sep 22, 2004 |
| Grant date | May 2, 2006 |
| Priority date | — |
| Expiry date | Sep 22, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31926
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention provides a test apparatus for testing circuit units (101a–101k) to be tested by means of a test system (100), having a connection device (102), tester channels (103a–103m) for connecting the test system (100) to the connection device (102) and receptacle units (104a–104k), having a number (n1, n2, . . . , nk) of circuit unit data channels dependent on the circuit units (101–101k) to be tested, provision being made of a changeover device (200) for changing over the tester channels (103a–103m) to the receptacle units (104a–104k), and it being possible to divide a number (m) of tester channels (103a–103m) between the number (n1, n2, . . . , nk) of circuit unit data channels in a predeterminable manner.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.