Erwin Thalmann
18Patents
3h-index
11Co-inventors
53Inventor score
Filing activity: Jul 1, 2002 → Aug 17, 2016
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6897646B2 | Method for testing wafers to be tested and calibration apparatus | Physics | 8 | Expired |
| US6882139B2 | Electronic component, tester device and method for calibrating a tester device | Physics | 6 | Expired |
| US7039544B2 | Method for testing circuit units to be tested and test apparatus | Physics | 4 | Expired |
| US7228477B2 | Apparatus and method for testing circuit units to be tested | Physics | 3 | Expired |
| US7276896B2 | Test apparatus and method for testing circuit units to be tested | Physics | 3 | Expired |
| US7184335B2 | Electronic memory apparatus, and method for deactivating redundant bit lines or word lines | Physics | 3 | Expired |
| US7321497B2 | Electronic circuit apparatus and method for stacking electronic circuit units | Electricity | 1 | Expired |
| US7254758B2 | Method and apparatus for testing circuit units to be tested with different test mode data sets | Physics | 1 | Expired |
| US7353425B2 | Data processing circuit apparatus having a data transmission unit of redundant design | Physics | 0 | Expired |
| US10018667B2 | Method for testing semiconductor dies | Physics | 0 | Active |
| US7343532B2 | Testing memory units in a digital circuit | Physics | 0 | Expired |
| US7340313B2 | Monitoring device for monitoring internal signals during initialization of an electronic circuit | Physics | 0 | Expired |
| US7188291B2 | Circuit and method for testing a circuit having memory array and addressing and control unit | Physics | 0 | Expired |
| US9435849B2 | Method for testing semiconductor dies and a test apparatus | Physics | 0 | Active |
| US7143325B2 | Method for testing circuit units to be tested by means of majority decisions and test device for performing the method | Physics | 0 | Expired |
| US7191085B2 | Method for testing an electric circuit | Physics | 0 | Expired |
| US7292479B2 | Memory device with multistage sense amplifier | Physics | 0 | Expired |
| US7308622B2 | Integrated memory and method for testing the memory | Physics | 0 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.