Method for optimizing the characteristics of integrated circuits components from circuit specifications
US7047505B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 16, 2001 |
| Grant date | May 16, 2006 |
| Priority date | — |
| Expiry date | May 15, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F30/367
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method for selecting a process for forming a device, includes generating a plurality of equations using a response surface methodology model. Each equation relates a respective device simulator input parameter to a respective combination of processing parameters that can be used to form the device or a respective combination of device characteristics. A model of a figure-of-merit circuit is formed that is representative of an integrated circuit into which the device is to be incorporated. One of the combinations of processing parameters or combinations of device characteristics is identified that results in a device satisfying a set of performance specifications for the figure-of-merit circuit, using the plurality of equations and the device simulator.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.