Patrick D. McNamara
10Patents
4h-index
21Co-inventors
56Inventor score
Filing activity: Sep 29, 2000 → Mar 25, 2019
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6978229B1 | Efficient method for modeling and simulation of the impact of local and global variation on integrated circuits | Electricity | 26 | Expired |
| US7003742B2 | Methodology for the optimization of testing and diagnosis of analog and mixed signal ICs and embedded cores | Physics | 14 | Expired |
| US7047505B2 | Method for optimizing the characteristics of integrated circuits components from circuit specifications | Physics | 10 | Expired |
| US8170828B2 | Test method using memory programmed with tests and protocol to communicate between device under test and tester | Physics | 4 | Active |
| US9395775B2 | Control scheme to temporarily raise supply voltage in response to sudden change in current demand | Emerging Cross-Sectional Technologies | 4 | Active |
| US9541603B2 | Method and apparatus for power glitch detection in integrated circuits | Physics | 3 | Active |
| US8578143B2 | Modifying operating parameters based on device use | Emerging Cross-Sectional Technologies | 2 | Active |
| US10241560B2 | Control scheme to temporarily raise supple voltage in response to sudden change in current demand | Emerging Cross-Sectional Technologies | 0 | Active |
| US8836366B2 | Method for testing integrated circuits with hysteresis | Physics | 0 | Active |
| US11079831B2 | Control scheme to temporarily raise supply voltage in response to sudden change in current demand | Emerging Cross-Sectional Technologies | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.