Semiconductor memory cell and semiconductor memory device
US7049628B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 24, 2003 |
| Grant date | May 23, 2006 |
| Priority date | — |
| Expiry date | May 11, 2023 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10D30/701
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The semiconductor memory cell is characterized in that at least one modulation region is provided between a first gate electrode of the gate electrode configuration and the insulation region, and in that the modulation region has or is formed from a material or modulation material having electrical and/or further material properties that can be modulated in a controllable manner between at least two states in such a way that, in accordance with these states of the modulation material or of the modulation region, the channel region can be influenced electromagnetically, in particular for a given electrical potential difference between the first gate electrode and the source/drain regions.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.