Patent · US Expired

Memory device with barrier layer

US7053445B1 · kind B1 · utility

7Cited by
2References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 2, 2005
Grant dateMay 30, 2006
Priority date
Expiry dateAug 2, 2025

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D64/685

Abstract

A memory device may include a substrate, a dielectric layer formed on the substrate and a charge storage element formed on the dielectric layer. The memory device may also include an inter-gate dielectric formed on the charge storage element, a barrier layer formed on the inter-gate dielectric and a control gate formed on the barrier layer. The barrier layer prevents reaction between the control gate and the inter-gate dielectric.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.