Embedded integrated circuit aging sensor system
US7054787B2 · kind B2 · utility
12Cited by
8References
25Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jan 23, 2003 |
| Grant date | May 30, 2006 |
| Priority date | — |
| Expiry date | Mar 30, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2829
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and apparatus for sensing an aging effect on an integrated circuit using a sensor disposed on the integrated circuit and arranged to generate an output dependent on a condition of an element within the sensor. A processor operatively connected to the sensor is arranged to indicate a code dependent the output.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.