Patent · US Expired

Method for isotropic etching of copper

US7056648B2 · kind B2 · utility

18Cited by
7References
15Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 17, 2003
Grant dateJun 6, 2006
Priority date
Expiry dateMar 4, 2024

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/32134
  • WIPO fieldSurface technology, coating
  • WIPO sectorChemistry

Abstract

Copper and copper alloys are etched to provide uniform and smooth surface by employing an aqueous composition that comprises an oxidant, a mixture of at least one weak complexant and at least one strong complexant for the copper or copper alloy, and water and has a pH of about 6 to about 12 so as to form an oxidized etch controlling layer and to uniformly remove the copper or copper alloy; and then removing the oxidized etch controlling layer with a non-oxidizing composition. Copper and copper alloy structure, having smooth upper surfaces are also provided.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.