Patent · US Expired

Methods of forming backside connections on a wafer stack

US7056813B2 · kind B2 · utility

62Cited by
9References
51Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 2, 2005
Grant dateJun 6, 2006
Priority date
Expiry dateMar 2, 2025

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/01079
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

Various methods of forming backside connections on a wafer stack are disclosed. To form the backside connections, vias are formed in a first wafer that is to be bonded with a second wafer. The vias used for the backside connections are formed on a side of the first wafer along with an interconnect structure, and the backside connections are formed on an opposing side of the first wafer using these vias.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.