Patent · US Expired

Semiconductor device, method for manufacturing the same, and plating solution

US7060618B2 · kind B2 · utility

10Cited by
12References
6Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 13, 2002
Grant dateJun 13, 2006
Priority date
Expiry dateAug 17, 2022

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/0002
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

The present invention relates to a semiconductor device and a method for manufacturing the same. The semiconductor device has an embedded interconnect structure in which an electric conductor, such as copper or silver, is embedded in fine recesses formed in a surface of a semiconductor substrate, and also has a protective film formed on surfaces of exposed interconnects that define the interconnect structure, to protect the interconnects. The protective film has a flattened surface.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.