Patent · US Expired

Bipolar transistor and method for fabricating it

US7064360B2 · kind B2 · utility

2Cited by
12References
21Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 4, 2002
Grant dateJun 20, 2006
Priority date
Expiry dateApr 12, 2022

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D10/891

Abstract

A method is provided to fabricate a bipolar transistor with a low base connection resistance, low defect density and improved scalability. Scalability is to be understood in this case as both the lateral scaling of the emitter window and the vertical scaling of the base width (low temperature budget). The temperature budget can be kept low in the base region since no implantations are required in order to reduce the base connection resistance. Furthermore, the difficulties associated with the point defects are largely avoided.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.