Patent · US Expired

Internal voltage generating circuit in semiconductor memory device

US7068547B2 · kind B2 · utility

8Cited by
9References
15Claims
0Family size

Assignee

Inventor

Key dates

Filing dateMar 2, 2004
Grant dateJun 27, 2006
Priority date
Expiry dateMar 2, 2024

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C5/147
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

An internal voltage generating circuit in a semiconductor memory device includes a comparing unit for comparing a voltage level of an internal voltage with that of a reference voltage, a pull-up driving unit for performing a pull-up operation for an output terminal in response to an output signal of the comparing unit, and a discharging unit for discharging the output terminal in a period of which the voltage level of the internal voltage is higher than a predetermined target voltage level.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.