Patent · US Expired

Method and apparatus for polishing substrates

US7070480B2 · kind B2 · utility

15Cited by
24References
13Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 10, 2002
Grant dateJul 4, 2006
Priority date
Expiry dateMay 12, 2023

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB24B37/26
  • WIPO fieldMachine tools
  • WIPO sectorMechanical engineering

Abstract

Method and apparatus for polishing substrates. A chemical mechanical polishing article comprises a body and a patterned surface. The patterned surface comprises a plurality of slurry distribution grooves and a plurality of islands on the body. Each of the plurality of the islands comprises a base portion, a polishing surface disposed thereon, and a contoured surface disposed therebetween. The base portion comprises one or more sidewalls defining at least a portion of the plurality of slurry distribution grooves. The polishing surface is smaller than the base portion, the difference therebetween attributable to the contoured surface. In a particular embodiment, conductive materials and low k dielectric films are polished with reduced or minimum substrate surface damage.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.