Patent · US Expired

Silicon carbide power devices with self-aligned source and well regions and methods of fabricating same

US7074643B2 · kind B2 · utility

49Cited by
77References
17Claims
0Family size

Assignee

Inventor

Key dates

Filing dateApr 24, 2003
Grant dateJul 11, 2006
Priority date
Expiry dateApr 24, 2023

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S438/931
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

Silicon carbide semiconductor devices and methods of fabricating silicon carbide semiconductor devices are provided by successively etching a mask layer to provide windows for formation of a source region or a first conductivity type, a buried silicon carbide region of a second conductivity type opposite to the first conductivity type and a second conductivity type well region in a first conductivity type silicon carbide layer. The source region and the buried silicon carbide region are formed utilizing a first window of the mask layer. Then, the well region is formed utilizing a second window of the mask layer, the second window being provided by a subsequent etch of the mask layer having the first window.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.