Patent · US Expired

Self aligned method of forming a semiconductor memory array of floating gate memory cells with buried bit-line and vertical word line transistor

US7074672B2 · kind B2 · utility

12Cited by
42References
22Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 10, 2004
Grant dateJul 11, 2006
Priority date
Expiry dateFeb 10, 2024

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D30/6893

Abstract

A self aligned method of forming a semiconductor memory array of floating gate memory cells in a semiconductor substrate, and an array formed thereby, whereby each memory cell includes a trench formed into a surface of a semiconductor substrate, spaced apart source and drain regions with a channel region formed therebetween. The drain region is formed underneath the trench, and the channel region includes a first portion that extends substantially vertically along a sidewall of the trench and a second portion that extends substantially horizontally along the surface of the substrate. An electrically conductive floating gate is formed over and insulated from at least a portion of the channel region and a portion of the source region. An electrically conductive control gate is formed having a first portion disposed in the trench and a second portion formed over but insulated from the floating gate.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.