Patent · US Expired

Microelectromechanical systems and devices having thin film encapsulated mechanical structures

US7075160B2 · kind B2 · utility

43Cited by
186References
43Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 4, 2003
Grant dateJul 11, 2006
Priority date
Expiry dateJun 24, 2023

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/0002
  • WIPO fieldMicro-structural and nano-technology
  • WIPO sectorChemistry

Abstract

There are many inventions described and illustrated herein. In one aspect, the present invention is directed to a MEMS device, and technique of fabricating or manufacturing a MEMS device, having mechanical structures encapsulated in a chamber prior to final packaging. The material that encapsulates the mechanical structures, when deposited, includes one or more of the following attributes: low tensile stress, good step coverage, maintains its integrity when subjected to subsequent processing, does not significantly and/or adversely impact the performance characteristics of the mechanical structures in the chamber (if coated with the material during deposition), and/or facilitates integration with high-performance integrated circuits. In one embodiment, the material that encapsulates the mechanical structures is, for example, silicon (polycrystalline, amorphous or porous, whether doped or undoped), silicon carbide, silicon-germanium, germanium, or gallium-arsenide.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.