Methods for imperfect insulating film electrical thickness/capacitance measurement
US7075318B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 9, 2004 |
| Grant date | Jul 11, 2006 |
| Priority date | — |
| Expiry date | Apr 27, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R27/26
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Methods for determining an electrical parameter of an insulating film are provided. One method includes measuring a surface potential of a leaky insulating film without inducing leakage across the insulating film and determining the electrical parameter from the surface potential. Another method includes applying an electrical field across the insulating film. Leakage across the insulating film caused by the electrical field is negligible. The method also includes measuring a surface potential of the specimen and determining a potential of the substrate. In addition, the method includes determining a pure voltage across the insulating film from the surface potential and the substrate potential. The method further includes determining the electrical parameter from the pure voltage. The electrical parameter may be capacitance or electrical thickness of the insulating film.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.