Event based IC test system
US7089135B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 20, 2002 |
| Grant date | Aug 8, 2006 |
| Priority date | — |
| Expiry date | Aug 9, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31928
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An event based test system for testing an IC device under test (DUT) designed under an automatic electronic design (EDA) environment. The event based test system includes an event memory for storing event data derived directly from simulation of design data for an intended IC in the EDA environment where the event data to denote each event is formed with time index indicating a time length from a predetermined point and an event type indicating a type of change at an event, an event generation unit for generating test vectors based on the event data where waveform of each vector is determined by the event type and a timing of the waveform is determined by accumulating the time index of previous events, and means for supplying test vectors to the DUT and evaluating response outputs of the DUT at predetermined timings.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.