Patent · US Expired

Method and system for evaluating timing in an integrated circuit

US7089143B2 · kind B2 · utility

25Cited by
23References
19Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 29, 2004
Grant dateAug 8, 2006
Priority date
Expiry dateMay 14, 2024

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/3016
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Methods for analyzing the timing in integrated circuits and for reducing the pessimism in timing slack calculations in static timing analysis (STA). The methods involve grouping and canceling the delay contributions of elements having similar delays in early and late circuit paths. An adjusted timing slack is calculated using the delay contributions of elements having dissimilar delays. In some embodiments, the delay contributions of elements having dissimilar delays are root sum squared. Embodiments of the invention provide methods for reducing the pessimism due to both cell-based and wire-dependent delays. The delays considered in embodiments of the invention may include delays due to the location of elements in a path.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.